Dr Das Arran
Ph. D. (Microelectronics)


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Teaching Commitment:

  1. FIT1005
  2. FIT3130
  3. FIT4017

Professional association:

  1. Member of South African Institute of Physics (SAIP)

Research interest:

  1. Fault Tolerant VLSI Design

Research publication:

  1. "Designing with gate arrays using Plessey Classic" Dataweek, April 7, 1989. "Plotting Transistor Characteristics using SPICE", Electronics For You, May 1995. Improved reliability of bistable circuits by selective hot-carrier stress reduction, A.G.M Das and S. Johnson, Microelectronics Reliability -38, Elsevier Science Ltd., pp 1177-1182, (1998). Thermal Stability of Ti/Mo Schottky Contacts on p-Si and Defects Introduced in p-Si During Electron Beam Deposition of Ti/Mo, A.G.M. Das, F. D. Auret, C. Nyamhere, M. Hayes and N. G. van der Berg, Solid State Phenomena Vol. 108-109 (December 2005) pp. 561-566.

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